Microstructural and magnetic characterization of ion-beam bombarded [Ni80Fe20-cr]50 thin films

C. Zheng; K.W. Lin; C.H. Liu; Chi Wah Leung; Y.H. Chen; T.H. Wu; R.D. Desautels; J.V. Lierop; P.W.T. Pong

Microstructural and magnetic characterization of ion-beam bombarded [Ni80Fe20-cr]50 thin films

C. Zheng, K.W. Lin, C.H. Liu, Chi Wah Leung, Y.H. Chen, T.H. Wu, R.D. Desautels, J.V. Lierop, P.W.T. Pong

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

Original language	English
Publication status	Published - 2014
Event	International Symposium on Next-Generation Electronics [ISNE] - Duration: 1 Jan 2014 → …

Conference

Conference	International Symposium on Next-Generation Electronics [ISNE]
Period	1/01/14 → …

Cite this

@conference{8029b988d0f34f42a661bd3061b4ddb2,

title = "Microstructural and magnetic characterization of ion-beam bombarded [Ni80Fe20-cr]50 thin films",

author = "C. Zheng and K.W. Lin and C.H. Liu and Leung, {Chi Wah} and Y.H. Chen and T.H. Wu and R.D. Desautels and J.V. Lierop and P.W.T. Pong",

year = "2014",

language = "English",

note = "International Symposium on Next-Generation Electronics [ISNE] ; Conference date: 01-01-2014",

}

Microstructural and magnetic characterization of ion-beam bombarded [Ni80Fe20-cr]50 thin films. / Zheng, C.; Lin, K.W.; Liu, C.H. et al.
2014. Paper presented at International Symposium on Next-Generation Electronics [ISNE].

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

TY - CONF

T1 - Microstructural and magnetic characterization of ion-beam bombarded [Ni80Fe20-cr]50 thin films

AU - Zheng, C.

AU - Lin, K.W.

AU - Liu, C.H.

AU - Leung, Chi Wah

AU - Chen, Y.H.

AU - Wu, T.H.

AU - Desautels, R.D.

AU - Lierop, J.V.

AU - Pong, P.W.T.

PY - 2014

Y1 - 2014

M3 - Conference presentation (not published in journal/proceeding/book)

T2 - International Symposium on Next-Generation Electronics [ISNE]

Y2 - 1 January 2014

ER -