Micromanipulation based on AFM: Probe tip selection

Shaorong Du; Yangmin Li

doi:10.1109/NANO.2007.4601242

Micromanipulation based on AFM: Probe tip selection

Shaorong Du
, Yangmin Li

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

4 Citations (Scopus)

Abstract

Micromanipulation based on AFM (atomic force microscope) has become popular in recent years. Since the AFM probe tip can have several shapes, how to select tip shape is discussed for micromanipulation in this paper. Based on the Hamaker hypotheses and the Lennard-Jones potential, interactions between probe and substrate surface are analyzed for three typical shape probe tips, namely, quadrilateral pyramid, cone, and paraboloid. Simulations are presented, and conclusion is obtained: a quadrilateral pyramid probe tip with small inclination between edge and axis is the best choice for micromanipulation based on AFM.

Original language	English
Title of host publication	2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings
Pages	506-510
Number of pages	5
DOIs	https://doi.org/10.1109/NANO.2007.4601242
Publication status	Published - 1 Dec 2007
Externally published	Yes
Event	2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007 - Hong Kong, Hong Kong Duration: 2 Aug 2007 → 5 Aug 2007

Conference

Conference	2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007
Country/Territory	Hong Kong
City	Hong Kong
Period	2/08/07 → 5/08/07

Keywords

AFM
Micromanipulation
Quadrilateral pyramid probe tip

ASJC Scopus subject areas

Electrical and Electronic Engineering
Atomic and Molecular Physics, and Optics

More information

10.1109/NANO.2007.4601242

Cite this

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title = "Micromanipulation based on AFM: Probe tip selection",

abstract = "Micromanipulation based on AFM (atomic force microscope) has become popular in recent years. Since the AFM probe tip can have several shapes, how to select tip shape is discussed for micromanipulation in this paper. Based on the Hamaker hypotheses and the Lennard-Jones potential, interactions between probe and substrate surface are analyzed for three typical shape probe tips, namely, quadrilateral pyramid, cone, and paraboloid. Simulations are presented, and conclusion is obtained: a quadrilateral pyramid probe tip with small inclination between edge and axis is the best choice for micromanipulation based on AFM.",

keywords = "AFM, Micromanipulation, Quadrilateral pyramid probe tip",

author = "Shaorong Du and Yangmin Li",

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AU - Du, Shaorong

AU - Li, Yangmin

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AB - Micromanipulation based on AFM (atomic force microscope) has become popular in recent years. Since the AFM probe tip can have several shapes, how to select tip shape is discussed for micromanipulation in this paper. Based on the Hamaker hypotheses and the Lennard-Jones potential, interactions between probe and substrate surface are analyzed for three typical shape probe tips, namely, quadrilateral pyramid, cone, and paraboloid. Simulations are presented, and conclusion is obtained: a quadrilateral pyramid probe tip with small inclination between edge and axis is the best choice for micromanipulation based on AFM.

KW - AFM

KW - Micromanipulation

KW - Quadrilateral pyramid probe tip

UR - https://www.scopus.com/pages/publications/52949084353

U2 - 10.1109/NANO.2007.4601242

DO - 10.1109/NANO.2007.4601242

M3 - Conference article published in proceeding or book

SN - 1424406080

SN - 9781424406081

SP - 506

EP - 510

BT - 2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings

T2 - 2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007

Y2 - 2 August 2007 through 5 August 2007

ER -

Micromanipulation based on AFM: Probe tip selection

Abstract

Conference

Keywords

ASJC Scopus subject areas

More information

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