Metal-organic chemical vapor deposition routes to films of transparent conducting oxides

  • A. Wang
  • , S. C. Cheng
  • , J. A. Belot
  • , R. J. McNeely
  • , J. Cheng
  • , B. Marcordes
  • , T. J. Marks
  • , Jiyan Dai
  • , R. P.H. Chang
  • , J. L. Schindler
  • , M. P. Chudzik
  • , C. R. Kannewurf

Research output: Journal article publicationConference articleAcademic researchpeer-review

Abstract

This contribution reports the in situ growth of transparent, conducting GaxIn2-xO3and ZnkIn2Ok+3films by MOCVD (metal-organic chemical vapor deposition) techniques using In(dpm)3, Ga(dpm)3, and Zn(dpm)2(dpm = dipivaloylmethanate) as volatile precursors. In the former series, film microstructure in the x = 0.4 - 1.0 range is predominantly cubic with 25 °C electrical conductivities as high as 1300 S/cm (n-type; carrier density = 1.2×1020cm-3, mobility = 68 cm2/Vs) and optical transparency in the visible region greater than that of ITO. In the latter series, films in the composition range k = 0.16 - 3.60 were studied; the microstructural systematics are rather complex. Electrical conductivities (25 °C) as high as 1000 S/cm (n-type; carrier density = 3.7×1020cm-3, mobility = 18.6 cm2/Vs) for k = 0.66 were measured. The optical transparency window is significantly broader than that of ITO.
Original languageEnglish
Pages (from-to)3-10
Number of pages8
JournalMaterials Research Society Symposium - Proceedings
Volume495
Publication statusPublished - 1 Jan 1998
Externally publishedYes
EventProceedings of the 1997 MRS Fall Meeting - Boston, MA, United States
Duration: 30 Nov 19974 Dec 1997

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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