Abstract
This contribution reports the in situ growth of transparent, conducting GaxIn2-xO3and ZnkIn2Ok+3films by MOCVD (metal-organic chemical vapor deposition) techniques using In(dpm)3, Ga(dpm)3, and Zn(dpm)2(dpm = dipivaloylmethanate) as volatile precursors. In the former series, film microstructure in the x = 0.4 - 1.0 range is predominantly cubic with 25 °C electrical conductivities as high as 1300 S/cm (n-type; carrier density = 1.2×1020cm-3, mobility = 68 cm2/Vs) and optical transparency in the visible region greater than that of ITO. In the latter series, films in the composition range k = 0.16 - 3.60 were studied; the microstructural systematics are rather complex. Electrical conductivities (25 °C) as high as 1000 S/cm (n-type; carrier density = 3.7×1020cm-3, mobility = 18.6 cm2/Vs) for k = 0.66 were measured. The optical transparency window is significantly broader than that of ITO.
Original language | English |
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Pages (from-to) | 3-10 |
Number of pages | 8 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 495 |
Publication status | Published - 1 Jan 1998 |
Externally published | Yes |
Event | Proceedings of the 1997 MRS Fall Meeting - Boston, MA, United States Duration: 30 Nov 1997 → 4 Dec 1997 |
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering