Meta-Cure: A reliability enhancement strategy for metadata in NAND flash memory storage systems

Yi Wang, Luis Angel D. Bathen, Nikil D. Dutt, Zili Shao

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

27 Citations (Scopus)


The increasing density of NAND flash memory leads to a dramatic increase in the bit error rate of flash, which greatly reduces the ability of error correcting codes (ECC) to handle multi-bit errors. To ensure the functionality and reliability of flash memory, the pages containing address mapping information and other metadata should be carefully stored in flash memory. This paper presents Meta-Cure, a novel hardware and file system interface that transparently protects metadata in the presence of multi-bit faults. Meta-Cure exploits built-in ECC and replication in order to protect pages containing critical data. Redundant pairs are formed at run time and distributed to different physical pages to protect against failures. Meta-Cure requires no changes to the file system, on-chip hierarchy, or hardware implementation of flash memory chip. Experimental results show that the proposed technique can reduce uncorrectable page errors by 92% with less than 1% space overhead in comparison with conventional error correction techniques.
Original languageEnglish
Title of host publicationProceedings of the 49th Annual Design Automation Conference, DAC '12
Number of pages6
Publication statusPublished - 11 Jul 2012
Event49th Annual Design Automation Conference, DAC '12 - San Francisco, CA, United States
Duration: 3 Jun 20127 Jun 2012


Conference49th Annual Design Automation Conference, DAC '12
Country/TerritoryUnited States
CitySan Francisco, CA


  • ECC
  • metadata
  • NAND flash memory
  • redundancy
  • reliability

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modelling and Simulation

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