Abstract
The phase detection method of photothermal deflection spectroscopy in the transverse configuration was used to measure the overall thermal diffusivity of silicon-boron (Si-B) alloy film on Corning 7059 glass substrate. Results were attained by observing the phase of deflection of the probe beam when it scanned above the film surface relative to the pump beam. Measurements were repeated for different modulation frequencies of the pump beam. Furthermore, both bouncing and skimming configurations were used. The effect of varying the distance between the probe beam and film surface was investigated.
Original language | English |
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Pages (from-to) | 5169-5173 |
Number of pages | 5 |
Journal | Journal of Materials Science |
Volume | 34 |
Issue number | 21 |
DOIs | |
Publication status | Published - 1 Nov 1999 |
ASJC Scopus subject areas
- Materials Science(all)