Measurement of ultralow injection current to polymethyl-methacrylate film

Feng Yan; Yi Hong; Helen L.W. Chan

doi:10.1063/1.2948853

Measurement of ultralow injection current to polymethyl-methacrylate film

Feng Yan, Yi Hong, Helen L.W. Chan

Research output: Journal article publication › Journal article › Academic research › peer-review

10 Citations (Scopus)

Abstract

Ultralow electron/hole injection currents from an electrode to a polymethyl-methacrylate (PMMA) film can be accurately decided by measuring the slow shift in the flatband voltage of a metal-insulator-semiconductor (MIS) device. It has been found that both the electron and hole injection currents are limited by the metal/PMMA interface and can be roughly described with a modified Richardson-Schottky equation. The space charge or dipole relaxation in PMMA films has been observed as well, which induces an instant change in flatband voltage of the MIS devices. These properties are critical issues for the stability of organic thin film transistors with PMMA gate insulator.

Original language	English
Article number	243301
Journal	Applied Physics Letters
Volume	92
Issue number	24
DOIs	https://doi.org/10.1063/1.2948853
Publication status	Published - 30 Jun 2008

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.2948853

http://hdl.handle.net/10397/400

Cite this

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Measurement of ultralow injection current to polymethyl-methacrylate film

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