Abstract
Thermophysical properties of thin films in microscale are much more different from that of bulk materials. It is very important to characterize their properties for the design and analysis of MEMS devices and ICs. In this paper we demonstrate a technique to test heat capacity of SnO2thin film. For this purpose, micro-hotplate (MHP) is used as a thin-film differential scanning calorimeter (TDSC). Micro-hotplate is a suspended structure that uses SiO2/Si3N4membrane as mechanical support and polysilicon resistors as heater and temperature sensor. Providing a pulsed power to the heater, MHP will be heated up with heating rate of about 200000 °C/s, and with TDSC technique, heat capacity of SnO2thin film with thickness of 300 nm is measured at temperature ranging from room temperature to 400 K.
Original language | English |
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Pages (from-to) | 234-237 |
Number of pages | 4 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 4601 |
DOIs | |
Publication status | Published - 1 Dec 2001 |
Externally published | Yes |
Event | Micromachining and Microfabrication Process Technology and Devices - Nanjing, China Duration: 7 Nov 2001 → 9 Nov 2001 |
Keywords
- Heat capacity
- Micro-hotplate (MHP)
- Thin-film differential scanning calorimeter (TDSC)
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics