Keyphrases
Light-emitting Diodes
100%
Process-based Model
100%
Lifetime Prediction
100%
Lumen Maintenance
100%
Phosphor-converted White Light-emitting Diodes
100%
Wiener Process
100%
Degradation Data
75%
Regression Approach
50%
Process-based Method
50%
Remaining Useful Lifetime
50%
Testing Conditions
25%
Prediction Problems
25%
Data-driven Approach
25%
Nonlinear Regression
25%
Failure Data
25%
Maximum Likelihood Estimation
25%
Diffusion Properties
25%
Lumen
25%
TM21
25%
Highly Reliable Products
25%
Accelerated Testing
25%
Prediction Uncertainty
25%
Lumen Degradation
25%
Degradation Modeling
25%
Deterministic Regression
25%
Reliability Prediction
25%
Computer Science
Light-Emitting Diode
100%
Driven Approach
20%
maximum-likelihood
20%
Likelihood Estimation
20%
Testing Condition
20%
Nonlinear Regression
20%
Reliability Prediction
20%
Engineering
Light-Emitting Diode
100%
Nonlinear Regression
20%
Testing Condition
20%
Prediction Problem
20%
Maximum Likelihood Estimation
20%
Failure Data
20%
Reliability Prediction
20%
Material Science
Light-Emitting Diode
100%