Engineering
Atomic Force Microscope
100%
Charge Transport
100%
Crystalline Quality
100%
Device Structure
100%
Field-Emission Scanning Electron Microscopy
100%
Fill Factor
100%
Film Quality
100%
Illustrates
100%
Negative Electrode
100%
One Step
100%
Open Circuit Voltage
100%
Performance Parameter
100%
Photocurrent
100%
Positive Electrode
100%
Power Conversion Efficiency
100%
Ray Diffraction
100%
Solar Cell
100%
Keyphrases
Atomic Force Field
33%
Atomic Force Microscope
33%
CH3NH3PbI3
100%
Charge Transport
33%
Crystal Quality
33%
Device Structure
33%
Distributed Performance
33%
Exposed Area
33%
Field Emission Scanning Electron Microscopy (FE-SEM)
33%
Fill Factor
33%
Film Morphology
33%
Film Quality
33%
Halide Perovskites
33%
Island Structure
33%
Low Pressure
100%
Low Pressure Treatment
33%
Negative Electrode
33%
One-step Method
33%
Open-circuit Voltage
33%
Performance Parameters
33%
Perovskite Film
100%
Photoelectric Performance
33%
Positive Electrode
33%
Power Conversion Efficiency
33%
Pressure Control
100%
Short-circuit Photocurrent
33%
Solar Cell
100%
Solution Synthesis
100%
X-ray Diffraction Spectroscopy
33%
Material Science
Crystalline Material
16%
Electronic Circuit
33%
Field Emission Scanning Electron Microscopy
16%
Film
100%
Halide
16%
Solar Cell
100%
X-Ray Diffractometry
16%