Local measurement of secondary electron emission from ZnO-coated carbon nanotubes

Lei Huang, Shu Ping Lau, H. Y. Yang, S. F. Yu

Research output: Journal article publicationJournal articleAcademic researchpeer-review

29 Citations (Scopus)


The secondary electron emission (SEE) of ZnO-coated carbon nanotubes (CNTs) was measured using a biasing technique in a scanning electron microscope. The SEE yield of the ZnO-coated CNTs is higher than that of the ZnO film deposited on Si substrates. Direct observation of the variation in SEE from tip-end and non-CNT positions was demonstrated. Local measurement reveals that the SEE yield at the tip-end of the ZnO-coated CNTs is much higher than that of non-CNT positions. The enhancement of SEE is attributed to the strong local field generated at the tip of the CNTs.
Original languageEnglish
Pages (from-to)1564-1567
Number of pages4
Issue number6
Publication statusPublished - 28 Mar 2006
Externally publishedYes

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering


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