Local measurement of secondary electron emission from ZnO-coated carbon nanotubes

Lei Huang; Shu Ping Lau; H. Y. Yang; S. F. Yu

doi:10.1088/0957-4484/17/6/005

Local measurement of secondary electron emission from ZnO-coated carbon nanotubes

Lei Huang, Shu Ping Lau, H. Y. Yang, S. F. Yu

Research output: Journal article publication › Journal article › Academic research › peer-review

29 Citations (Scopus)

Abstract

The secondary electron emission (SEE) of ZnO-coated carbon nanotubes (CNTs) was measured using a biasing technique in a scanning electron microscope. The SEE yield of the ZnO-coated CNTs is higher than that of the ZnO film deposited on Si substrates. Direct observation of the variation in SEE from tip-end and non-CNT positions was demonstrated. Local measurement reveals that the SEE yield at the tip-end of the ZnO-coated CNTs is much higher than that of non-CNT positions. The enhancement of SEE is attributed to the strong local field generated at the tip of the CNTs.

Original language	English
Pages (from-to)	1564-1567
Number of pages	4
Journal	Nanotechnology
Volume	17
Issue number	6
DOIs	https://doi.org/10.1088/0957-4484/17/6/005
Publication status	Published - 28 Mar 2006
Externally published	Yes

ASJC Scopus subject areas

Bioengineering
General Chemistry
General Materials Science
Mechanics of Materials
Mechanical Engineering
Electrical and Electronic Engineering

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10.1088/0957-4484/17/6/005

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abstract = "The secondary electron emission (SEE) of ZnO-coated carbon nanotubes (CNTs) was measured using a biasing technique in a scanning electron microscope. The SEE yield of the ZnO-coated CNTs is higher than that of the ZnO film deposited on Si substrates. Direct observation of the variation in SEE from tip-end and non-CNT positions was demonstrated. Local measurement reveals that the SEE yield at the tip-end of the ZnO-coated CNTs is much higher than that of non-CNT positions. The enhancement of SEE is attributed to the strong local field generated at the tip of the CNTs.",

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AU - Huang, Lei

AU - Lau, Shu Ping

AU - Yang, H. Y.

AU - Yu, S. F.

PY - 2006/3/28

Y1 - 2006/3/28

N2 - The secondary electron emission (SEE) of ZnO-coated carbon nanotubes (CNTs) was measured using a biasing technique in a scanning electron microscope. The SEE yield of the ZnO-coated CNTs is higher than that of the ZnO film deposited on Si substrates. Direct observation of the variation in SEE from tip-end and non-CNT positions was demonstrated. Local measurement reveals that the SEE yield at the tip-end of the ZnO-coated CNTs is much higher than that of non-CNT positions. The enhancement of SEE is attributed to the strong local field generated at the tip of the CNTs.

AB - The secondary electron emission (SEE) of ZnO-coated carbon nanotubes (CNTs) was measured using a biasing technique in a scanning electron microscope. The SEE yield of the ZnO-coated CNTs is higher than that of the ZnO film deposited on Si substrates. Direct observation of the variation in SEE from tip-end and non-CNT positions was demonstrated. Local measurement reveals that the SEE yield at the tip-end of the ZnO-coated CNTs is much higher than that of non-CNT positions. The enhancement of SEE is attributed to the strong local field generated at the tip of the CNTs.

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U2 - 10.1088/0957-4484/17/6/005

DO - 10.1088/0957-4484/17/6/005

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VL - 17

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EP - 1567

JO - Nanotechnology

JF - Nanotechnology

IS - 6

ER -

Local measurement of secondary electron emission from ZnO-coated carbon nanotubes

Abstract

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