TY - GEN
T1 - Lifetime prediction of the film capacitor based on early degradation information
AU - Zhang, Yi
AU - Wang, Zhongxu
AU - Zhao, Shuai
AU - Blaabjerg, Frede
AU - Wang, Huai
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021/6/14
Y1 - 2021/6/14
N2 - Long-term reliability testing time of power electronic components (e.g., film capacitors) entails delayed feedback of their performance, often many months to years, which has been one of critical limitations for accelerating power electronic technology development. In this paper, we explore a method to reduce the reliability testing time by exploiting capacitor's early-degradation information. In contrast to the conventional testing methods based on end-of-life (EOL) data alone, the proposed method makes more use of early degradation information in the reliability testing. The proposed method can predict the EOL lifetime of the film capacitor with 2.5% degradation testing only. The maximum error of the predicted result is less than 5% error compared to the conventional test-to-fail method. The proposed work serves as a first step to reduce the reliability testing time and accelerate the technology development of power electronics.
AB - Long-term reliability testing time of power electronic components (e.g., film capacitors) entails delayed feedback of their performance, often many months to years, which has been one of critical limitations for accelerating power electronic technology development. In this paper, we explore a method to reduce the reliability testing time by exploiting capacitor's early-degradation information. In contrast to the conventional testing methods based on end-of-life (EOL) data alone, the proposed method makes more use of early degradation information in the reliability testing. The proposed method can predict the EOL lifetime of the film capacitor with 2.5% degradation testing only. The maximum error of the predicted result is less than 5% error compared to the conventional test-to-fail method. The proposed work serves as a first step to reduce the reliability testing time and accelerate the technology development of power electronics.
UR - https://www.scopus.com/pages/publications/85115685251
U2 - 10.1109/APEC42165.2021.9487459
DO - 10.1109/APEC42165.2021.9487459
M3 - Conference article published in proceeding or book
AN - SCOPUS:85115685251
T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
SP - 407
EP - 412
BT - 2021 IEEE Applied Power Electronics Conference and Exposition, APEC 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 36th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2021
Y2 - 14 June 2021 through 17 June 2021
ER -