Lifetime estimation of high-power white LED using degradation-data-driven method

Jiajie Fan, Kam Chuen Yung, Michael Pecht

Research output: Journal article publicationJournal articleAcademic researchpeer-review

122 Citations (Scopus)

Abstract

High-power white light-emitting diodes (HPWLEDs) have attracted much attention in the lighting market. However, as one of the highly reliable electronic products which may be not likely to fail under the traditional life test or even accelerated life test, HPWLED's lifetime is difficult to estimate by using traditional reliability assessment techniques. In this paper, the degradation-data-driven method (DDDM), which is based on the general degradation path model, was used to predict the reliability of HPWLED through analyzing the lumen maintenance data collected from the IES LM-80-08 lumen maintenance test standard. The final predicted results showed that much more reliability information (e.g., mean time to failure, confidence interval, reliability function, and so on) and more accurate prediction results could be obtained by DDDM including the approximation method, the analytical method, and the two-stage method compared to the IES TM-21-11 lumen lifetime estimation method. Among all these three methods, the two-stage method produced the highest prediction accuracy.
Original languageEnglish
Article number6166442
Pages (from-to)470-477
Number of pages8
JournalIEEE Transactions on Device and Materials Reliability
Volume12
Issue number2
DOIs
Publication statusPublished - 14 Jun 2012

Keywords

  • Degradation-data-driven method (DDDM)
  • high-power white light-emitting diode (HPWLED)
  • lifetime estimation
  • reliability

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality

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