Laser ultrasonic microscopy

Matt Clark; Steve D. Sharples; Michael Geoffrey Somekh

Laser ultrasonic microscopy

Matt Clark, Steve D. Sharples, Michael Geoffrey Somekh

Research output: Publication in policy / professional / specialist journal › Article (for policy / professional audience) › Academic research › peer-review

7 Citations (Scopus)

Abstract

We demonstrate a fast optical scanning wave microscope. This acoustic microscope may be thought of as a noncontact (hence nondestructive) surface acoustic microscope. The key to obtaining a sufficient system signal to noise ratio without surface damage is tailoring of the generating optical distribution. This can be used to spread the optical power on the sample surface (preventing damage) and to focus the acoustic waves (increasing the amplitude). This paper introduces the optical scanning acoustic wave microscope, demonstrating some of its imaging capabilities, and discusses some of the ongoing work developing the techniques involved.

Original language	English
Pages	1094-1098
Number of pages	5
Volume	60
No.	9
Specialist publication	Materials Evaluation
Publication status	Published - 1 Sept 2002
Externally published	Yes

Keywords

Acoustic microscopy
Laser ultrasonic microscopy
Optical microscopy
Optical nondestructive testing
Optical scanning acoustic wave microscope
Signal to noise ratio

ASJC Scopus subject areas

Materials Science (miscellaneous)

Cite this

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abstract = "We demonstrate a fast optical scanning wave microscope. This acoustic microscope may be thought of as a noncontact (hence nondestructive) surface acoustic microscope. The key to obtaining a sufficient system signal to noise ratio without surface damage is tailoring of the generating optical distribution. This can be used to spread the optical power on the sample surface (preventing damage) and to focus the acoustic waves (increasing the amplitude). This paper introduces the optical scanning acoustic wave microscope, demonstrating some of its imaging capabilities, and discusses some of the ongoing work developing the techniques involved.",

keywords = "Acoustic microscopy, Laser ultrasonic microscopy, Optical microscopy, Optical nondestructive testing, Optical scanning acoustic wave microscope, Signal to noise ratio",

author = "Matt Clark and Sharples, {Steve D.} and Somekh, {Michael Geoffrey}",

year = "2002",

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AU - Clark, Matt

AU - Sharples, Steve D.

AU - Somekh, Michael Geoffrey

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N2 - We demonstrate a fast optical scanning wave microscope. This acoustic microscope may be thought of as a noncontact (hence nondestructive) surface acoustic microscope. The key to obtaining a sufficient system signal to noise ratio without surface damage is tailoring of the generating optical distribution. This can be used to spread the optical power on the sample surface (preventing damage) and to focus the acoustic waves (increasing the amplitude). This paper introduces the optical scanning acoustic wave microscope, demonstrating some of its imaging capabilities, and discusses some of the ongoing work developing the techniques involved.

AB - We demonstrate a fast optical scanning wave microscope. This acoustic microscope may be thought of as a noncontact (hence nondestructive) surface acoustic microscope. The key to obtaining a sufficient system signal to noise ratio without surface damage is tailoring of the generating optical distribution. This can be used to spread the optical power on the sample surface (preventing damage) and to focus the acoustic waves (increasing the amplitude). This paper introduces the optical scanning acoustic wave microscope, demonstrating some of its imaging capabilities, and discusses some of the ongoing work developing the techniques involved.

KW - Acoustic microscopy

KW - Laser ultrasonic microscopy

KW - Optical microscopy

KW - Optical nondestructive testing

KW - Optical scanning acoustic wave microscope

KW - Signal to noise ratio

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M3 - Article (for policy / professional audience)

SN - 0025-5327

VL - 60

SP - 1094

EP - 1098

JO - Materials Evaluation

JF - Materials Evaluation

ER -

Laser ultrasonic microscopy

Abstract

Keywords

ASJC Scopus subject areas

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