Abstract
Subsurface imaging in a non-contacting surface acoustic wave microscope is demonstrated, using mode conversion from Rayleigh to Lamb modes. The fact that, unlike in a conventional acoustic microscope, the technique does not require fluid couplants allows new contrast mechanisms to be used for the quantification of defects.
| Original language | English |
|---|---|
| Pages (from-to) | 1886-1887 |
| Number of pages | 2 |
| Journal | Electronics Letters |
| Volume | 35 |
| Issue number | 21 |
| DOIs | |
| Publication status | Published - 14 Oct 1999 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
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