Abstract
Subsurface imaging in a non-contacting surface acoustic wave microscope is demonstrated, using mode conversion from Rayleigh to Lamb modes. The fact that, unlike in a conventional acoustic microscope, the technique does not require fluid couplants allows new contrast mechanisms to be used for the quantification of defects.
Original language | English |
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Pages (from-to) | 1886-1887 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 35 |
Issue number | 21 |
DOIs | |
Publication status | Published - 14 Oct 1999 |
Externally published | Yes |
ASJC Scopus subject areas
- Electrical and Electronic Engineering