ISOS : space overlapping based on iteration access patterns for dynamic scratch-pad memory management in embedded systems

Y. Yang; Zili Shao; L. Pan; M. Guo

ISOS : space overlapping based on iteration access patterns for dynamic scratch-pad memory management in embedded systems

Y. Yang, Zili Shao, L. Pan, M. Guo

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

Original language	English
Pages	1360-1366
Number of pages	7
Publication status	Published - 2008
Event	International Conference for Young Computer Scientists - Duration: 1 Jan 2008 → …

Conference

Conference	International Conference for Young Computer Scientists
Period	1/01/08 → …

Cite this

@conference{fccd91dd52ea4f2ebcba7cf7f36d64e4,

title = "ISOS : space overlapping based on iteration access patterns for dynamic scratch-pad memory management in embedded systems",

author = "Y. Yang and Zili Shao and L. Pan and M. Guo",

year = "2008",

language = "English",

pages = "1360--1366",

note = "International Conference for Young Computer Scientists ; Conference date: 01-01-2008",

}

ISOS : space overlapping based on iteration access patterns for dynamic scratch-pad memory management in embedded systems. / Yang, Y.; Shao, Zili; Pan, L. et al.
2008. 1360-1366 Paper presented at International Conference for Young Computer Scientists.

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

TY - CONF

T1 - ISOS : space overlapping based on iteration access patterns for dynamic scratch-pad memory management in embedded systems

AU - Yang, Y.

AU - Shao, Zili

AU - Pan, L.

AU - Guo, M.

PY - 2008

Y1 - 2008

M3 - Conference presentation (not published in journal/proceeding/book)

SP - 1360

EP - 1366

T2 - International Conference for Young Computer Scientists

Y2 - 1 January 2008

ER -