Investigation of the dielectric relaxation mechanisms for Pb(Fe1/2Nb1/2)O3 single crystal based on the universal relaxation law

Xiaobing Li, Cong Tao, Shengdong Nie, Xuan Ren, Haiqing Xu, Haosu Luo, Kwok Ho Lam, Xiaoming Jiang, Zhi Guo

Research output: Journal article publicationJournal articleAcademic researchpeer-review

Abstract

Large-sized multiferroics Pb(Fe1/2Nb1/2)O3 (PFN) single crystal was grown by Bridgeman method in order to understand the giant dielectric response by investigating the electrical conductivity and dielectric properties. The synchrotron radiation soft x-ray absorption spectrum revealed the valence states of Fe in PFN crystal. PFN exhibits semiconductor behaviors in the thermal active electrical conductivity investigation. Besides, the frequency-dependent dielectric constants were measured in the frequency range from 100 Hz to 1 MHz to study the dielectric relaxation behaviors. Two relaxation processes were found and described by Havriliak-Negami equation. The origin of dielectric relaxation in PFN with semiconductor characters was discussed based on the universal relaxation law for a dipolar system.

Original languageEnglish
Article number413394
JournalPhysica B: Condensed Matter
Volume624
DOIs
Publication statusPublished - 1 Jan 2022

Keywords

  • Bridgeman method
  • Dielectric relaxation
  • Ferroelectric single crystal
  • X-ray absorption spectrum

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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