Investigating electro-mechanical signals from collocated piezoelectric wafers for the reference-free damage diagnosis of a plate

The electro-mechanical (EM) signals from piezoelectric (PZT) wafers are investigated for reference-free damage diagnosis so that a notch in a plate can be detected without requiring direct comparison with a baseline EM signal. Two identical PZT wafers collocated on both surfaces of a plate are utilized for extracting the mode-converted Lamb wave signals created by a notch. As harmonic input voltage signals are exerted on the collocated PZT wafers, the corresponding mode-converted Lamb wave signals become steady-state in the presence of damage. Applying fast Fourier transform to these mode-converted Lamb wave signals followed by a proper normalization, the EM signals associated with the mode conversion can be obtained. The theoretical finding of this paper is validated through spectral element simulations of a cantilever beam with a notch. The effects of the size and the location of the notch on the mode-converted EM signals are investigated as well. Finally, the applicability of the decomposed EM signals to reference-free damage diagnosis is discussed.