Interfacial defects in resistive switching devices probed by thermal analysis

H. K. Lau, Chi Wah Leung, W. H. Hu, P. K.L. Chan

Research output: Journal article publicationJournal articleAcademic researchpeer-review

6 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Interfacial defects in resistive switching devices probed by thermal analysis'. Together they form a unique fingerprint.

Keyphrases

Engineering

Physics

Material Science