Keyphrases
Radio Frequency Magnetron Sputtering
100%
Trilayer
100%
Infrared-reflective
100%
Reflective Properties
100%
Infrared Reflection
75%
X Ray Diffraction
50%
Reflection Properties
50%
Energy Conservation
25%
Fourier Transform Infrared Spectroscopy (FT-IR)
25%
Atomic Force Microscopy
25%
Tri-layer Films
25%
Sheet Resistance
25%
Layer Thickness
25%
Probe System
25%
Surface Morphology
25%
Glass Substrate
25%
Structured Surface
25%
Scanning Electron Microscope
25%
Transmission Spectrum
25%
Four-point Probe
25%
Inner Layer
25%
Continuous Film
25%
Magnetron Sputtering Technology
25%
Color Scale
25%
Visible Color
25%
Visible Transmittance
25%
Average Visible Transmittance
25%
CIELAB System
25%
Reflection Rate
25%
Engineering
Ray Diffraction
100%
Magnetron
100%
Radio Frequency
100%
Promising Candidate
50%
Structure Surface
50%
Layer Thickness
50%
Probe Point
50%
Colour Scale
50%
Atomic Force Microscopy
50%
Surface Morphology
50%
Scanning Electron Microscope
50%
Crystal Structure
50%
Glass Substrate
50%
FTIR Spectroscopy
50%
Material Science
Magnetron Sputtering
100%
Film
100%
X-Ray Diffraction
100%
Scanning Electron Microscopy
50%
Surface Morphology
50%
Electrical Resistivity
50%
Fourier Transform Infrared Spectroscopy
50%
Atomic Force Microscopy
50%
Crystal Structure
50%
Physics
Magnetron Sputtering
100%
Transmittance
100%
X Ray Diffraction
66%
Electron Microscope
33%
Atomic Force Microscopy
33%
FTIR Spectroscopy
33%
Crystal Structure
33%