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Influence of indium-tin-oxide thin-film quality on reverse leakage current of indium-tin-oxide/n-GaN Schottky contacts
R. X. Wang, S. J. Xu, A. B. Djurišić, C. D. Beling, C. K. Cheung, C. H. Cheung, S. Fung, D. G. Zhao, H. Yang, Xiaoming Tao
Research output: Journal article publication › Journal article › Academic research › peer-review
11
Citations
(Scopus)