Abstract
The influence of the absorption of the defect layer, the imaginary part of the refractive index (n), on the properties of the thin-film infrared filter with a narrow-band pass was evaluated by means of the characteristic matrix method. The calculated results show that the absorption of the defect layer significantly affects the properties of the filter, such as the number of the omni-directional band gap, its band width, and its band gap rate. For example, as n=2.2-0i changed into n=2.2-0.03i, two omni-directional band gaps were observed with decreasing band width and band gap rate. When n=2.2-0.05i and n=2.2-0.1i, only one omni-directional gap was observed with reduced band width and band gap rate. When n=2.2-0.3i, the omni-directional gap vanished. As the reflectance of the defect layer increased, both the transmittance and absorptance (if any) slowly decreased to zero.
Original language | English |
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Pages (from-to) | 1057-1060 |
Number of pages | 4 |
Journal | Zhenkong Kexue yu Jishu Xuebao/Journal of Vacuum Science and Technology |
Volume | 33 |
Issue number | 10 |
DOIs | |
Publication status | Published - 1 Oct 2013 |
Externally published | Yes |
Keywords
- Absorption
- Narrowband filter
- Omnidirectional band gap
- Reflectance rate
- Transmittance rate
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry