Abstract
Functional materials with various photoresponse performances have attracted much attention for their irreplaceable role in key fields such as clean energy, communications, and pollution disposal. The ability of in situ characterizing the dynamic behavior under light illumination would provide an in-depth understanding of structure–property relationships, which is essential for further improvements. In the past few decades, specialized TEMs, TEM holders as well as MEMS chips have been developed to realize in situ stimulation and detection of light signals and related physical responses of TEM sample. These significant technical progresses have promoted the investigation of functional materials and devices. This chapter focuses on the basic technique principles and implementations of three typical routes in present in situ optical TEM, including integration of light-paths inside TEMs or holders, modification of TEM-STM holders, and development of optical MEMS chips. Several application cases based on the associated methods are reviewed to demonstrate the design and operation of in situ optical experiments.
Original language | English |
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Title of host publication | In-Situ Transmission Electron Microscopy |
Place of Publication | Singapore |
Publisher | Springer |
Chapter | 6 |
Pages | 151-186 |
Number of pages | 36 |
ISBN (Electronic) | 978-981-19-6845-7 |
ISBN (Print) | 978-981-19-6844-0 |
DOIs | |
Publication status | Published - 8 Feb 2023 |