Improving Ranking-Oriented Defect Prediction Using a Cost-Sensitive Ranking SVM

Xiao Yu, Jin Liu, Jacky Wai Keung, Qing Li, Kwabena Ebo Bennin, Zhou Xu, Junping Wang, Xiaohui Cui

Research output: Journal article publicationJournal articleAcademic researchpeer-review

Original languageEnglish
Pages (from-to)139-153
Number of pages15
JournalIEEE Transactions on Reliability
DOIs
Publication statusPublished - Mar 2020

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