Abstract
Pentacene organic thin-film transistors (OTFTs) with high-k NdON gate dielectric incorporating different Ti contents are fabricated and their physical and electrical characteristics are studied. With appropriate Ti content, the OTFT with NdTiON as gate dielectric can achieve improved performance, e.g. a carrier mobility of 0.80 cm2/V·s, a small threshold voltage of -1.25 V, and a small sub-threshold swing of 0.13 V/dec. The AFM results of the pentacene layer and the dielectric layer reveal that incorporating Ti into NdON can obtain a smoother dielectric surface, which should be due to the suppressed hygroscopicity of Nd oxide caused by the Ti incorporation. Both the smoother dielectric surface and thus larger pentacene grains grown are responsible for the improved carrier mobility of the device.
Original language | English |
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Title of host publication | EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits |
Publisher | IEEE |
Pages | 1-2 |
Number of pages | 2 |
Volume | 2017-January |
ISBN (Electronic) | 9781538629079 |
DOIs | |
Publication status | Published - 1 Dec 2017 |
Event | 13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017 - Zyxel Auditorium and Learning Resource Center, National Tsing Hua University, Hsinchu, Taiwan Duration: 18 Oct 2017 → 20 Oct 2017 |
Conference
Conference | 13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017 |
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Country/Territory | Taiwan |
City | Hsinchu |
Period | 18/10/17 → 20/10/17 |
Keywords
- high-k
- NdTiON dielectric
- Organic thin-film transistor
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Hardware and Architecture
- Electrical and Electronic Engineering