Impact of VCE,sat measurement conditions on cycle-to-failure determination of IGBT samples in power cycling test

Yichi Zhang, Yi Zhang (Corresponding Author), Bo Yao, Huai Wang

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

This paper investigates the impact of different measurement conditions of on-state saturation voltage, in terms of current and temperature, on the cycle-to-failure determination of IGBT samples in the power cycling test. It is based on comparing the obtained cycle-to-failure according to the end-of-life (EOL) criterion and the cycle-to-failure when the respective samples become open circuits. The results from two of the representative measurement conditions are experimentally compared based on the widely used percentage-based EOL criterion and a recently proposed gradient-based EOL criterion.

Original languageEnglish
Title of host publicationCIPS 2024 - 13th International Conference on Integrated Power Electronics Systems
PublisherVDE Verlag GmbH
Pages598-602
Number of pages5
ISBN (Electronic)9783800762880
Publication statusPublished - 19 Jun 2024
Event13th International Conference on Integrated Power Electronics Systems, CIPS 2024 - Dusseldorf, Germany
Duration: 12 Mar 202414 Mar 2024

Publication series

NameETG-Fachbericht
Volume173
ISSN (Print)0341-3934

Conference

Conference13th International Conference on Integrated Power Electronics Systems, CIPS 2024
Country/TerritoryGermany
CityDusseldorf
Period12/03/2414/03/24

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Energy Engineering and Power Technology

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