Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope

Chi Wen Yang; Din Ping Tsai; Howard E. Jackson

Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope

Chi Wen Yang, Din Ping Tsai, Howard E. Jackson

Research output: Journal article publication › Conference article › Academic research › peer-review

Abstract

Imaging the local evanescent intensity gradients by using a tapping-mode near-field scanning optical microscope is developed. Two different optical structures, one a well-characterized BK-7 glass prism in the total internal reflection configuration, and the other a side-polished optical fiber waveguide with a step index of refraction, were studied. Results show distinct imaging contrasts of the intensity gradients, and reveal the variations of the local index of refraction of waveguide. This is a novel near-field optical method, and can be used in the imaging of local index of refraction of a variety of optical waveguide structures.

Original language	English
Pages (from-to)	313-318
Number of pages	6
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3896
Publication status	Published - 30 Nov 1999
Externally published	Yes
Event	Proceedings of the 1999 Design, Fabrication, and Characterization of Photonic Devices - Singapore, Singapore Duration: 30 Nov 1999 → 3 Dec 1999

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Cite this

@article{8a911eb31e0f41b2bda1f0cc26d47479,

title = "Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope",

abstract = "Imaging the local evanescent intensity gradients by using a tapping-mode near-field scanning optical microscope is developed. Two different optical structures, one a well-characterized BK-7 glass prism in the total internal reflection configuration, and the other a side-polished optical fiber waveguide with a step index of refraction, were studied. Results show distinct imaging contrasts of the intensity gradients, and reveal the variations of the local index of refraction of waveguide. This is a novel near-field optical method, and can be used in the imaging of local index of refraction of a variety of optical waveguide structures.",

author = "Yang, \{Chi Wen\} and Tsai, \{Din Ping\} and Jackson, \{Howard E.\}",

year = "1999",

month = nov,

day = "30",

language = "English",

volume = "3896",

pages = "313--318",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Proceedings of the 1999 Design, Fabrication, and Characterization of Photonic Devices ; Conference date: 30-11-1999 Through 03-12-1999",

}

Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope. / Yang, Chi Wen; Tsai, Din Ping; Jackson, Howard E.
In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 3896, 30.11.1999, p. 313-318.

Research output: Journal article publication › Conference article › Academic research › peer-review

TY - JOUR

T1 - Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope

AU - Yang, Chi Wen

AU - Tsai, Din Ping

AU - Jackson, Howard E.

PY - 1999/11/30

Y1 - 1999/11/30

N2 - Imaging the local evanescent intensity gradients by using a tapping-mode near-field scanning optical microscope is developed. Two different optical structures, one a well-characterized BK-7 glass prism in the total internal reflection configuration, and the other a side-polished optical fiber waveguide with a step index of refraction, were studied. Results show distinct imaging contrasts of the intensity gradients, and reveal the variations of the local index of refraction of waveguide. This is a novel near-field optical method, and can be used in the imaging of local index of refraction of a variety of optical waveguide structures.

AB - Imaging the local evanescent intensity gradients by using a tapping-mode near-field scanning optical microscope is developed. Two different optical structures, one a well-characterized BK-7 glass prism in the total internal reflection configuration, and the other a side-polished optical fiber waveguide with a step index of refraction, were studied. Results show distinct imaging contrasts of the intensity gradients, and reveal the variations of the local index of refraction of waveguide. This is a novel near-field optical method, and can be used in the imaging of local index of refraction of a variety of optical waveguide structures.

UR - https://www.scopus.com/pages/publications/0033347122

M3 - Conference article

AN - SCOPUS:0033347122

SN - 0277-786X

VL - 3896

SP - 313

EP - 318

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Proceedings of the 1999 Design, Fabrication, and Characterization of Photonic Devices

Y2 - 30 November 1999 through 3 December 1999

ER -

Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope

Abstract

ASJC Scopus subject areas

Other files and links

Fingerprint

Cite this