Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope

Chi Wen Yang, Din Ping Tsai, Howard E. Jackson

Research output: Journal article publicationConference articleAcademic researchpeer-review

Abstract

Imaging the local evanescent intensity gradients by using a tapping-mode near-field scanning optical microscope is developed. Two different optical structures, one a well-characterized BK-7 glass prism in the total internal reflection configuration, and the other a side-polished optical fiber waveguide with a step index of refraction, were studied. Results show distinct imaging contrasts of the intensity gradients, and reveal the variations of the local index of refraction of waveguide. This is a novel near-field optical method, and can be used in the imaging of local index of refraction of a variety of optical waveguide structures.

Original languageEnglish
Pages (from-to)313-318
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3896
Publication statusPublished - 30 Nov 1999
Externally publishedYes
EventProceedings of the 1999 Design, Fabrication, and Characterization of Photonic Devices - Singapore, Singapore
Duration: 30 Nov 19993 Dec 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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