Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output

C.H. Chu; B.J. Wu; T.S. Kao; Y.H. Fu; H.-P. Chiang; Din-ping Tsai

doi:10.1109/TMAG.2009.2016156

Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output

C.H. Chu
, B.J. Wu
, T.S. Kao
, Y.H. Fu
, H.-P. Chiang
, Din-ping Tsai

Research output: Journal article publication › Journal article › Academic research › peer-review

6 Citations (Scopus)

Abstract

The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance. © 2009 IEEE.

Original language	English
Article number	4815988
Pages (from-to)	2221-2223
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	45
Issue number	5
DOIs	https://doi.org/10.1109/TMAG.2009.2016156
Publication status	Published - 1 May 2009
Externally published	Yes

Keywords

Conductive-atomic force microscopy (C-AFM)
Jitter
Recording mark
Writing strategy

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

More information

10.1109/TMAG.2009.2016156

Cite this

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abstract = "The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance. {\textcopyright} 2009 IEEE.",

keywords = "Conductive-atomic force microscopy (C-AFM), Jitter, Recording mark, Writing strategy",

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AU - Chu, C.H.

AU - Wu, B.J.

AU - Kao, T.S.

AU - Fu, Y.H.

AU - Chiang, H.-P.

AU - Tsai, Din-ping

PY - 2009/5/1

Y1 - 2009/5/1

N2 - The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance. © 2009 IEEE.

AB - The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance. © 2009 IEEE.

KW - Conductive-atomic force microscopy (C-AFM)

KW - Jitter

KW - Recording mark

KW - Writing strategy

UR - https://www.scopus.com/pages/publications/65349170060

U2 - 10.1109/TMAG.2009.2016156

DO - 10.1109/TMAG.2009.2016156

M3 - Journal article

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JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

IS - 5

M1 - 4815988

ER -

Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output

Abstract

Keywords

ASJC Scopus subject areas

More information

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