Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output

C.H. Chu, B.J. Wu, T.S. Kao, Y.H. Fu, H.-P. Chiang, Din-ping Tsai

Research output: Journal article publicationJournal articleAcademic researchpeer-review

6 Citations (Scopus)

Abstract

The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance. © 2009 IEEE.
Original languageEnglish
Article number4815988
Pages (from-to)2221-2223
Number of pages3
JournalIEEE Transactions on Magnetics
Volume45
Issue number5
DOIs
Publication statusPublished - 1 May 2009
Externally publishedYes

Keywords

  • Conductive-atomic force microscopy (C-AFM)
  • Jitter
  • Recording mark
  • Writing strategy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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