Imaging near-field transverse modes of vertical-cavity surface-emitting lasers by near-field scanning optical microscopy

N.H. Lu, C.Y. Chen, C.S. Lin, W.-C. Liu, Din-ping Tsai

Research output: Journal article publicationJournal articleAcademic researchpeer-review

2 Citations (Scopus)

Abstract

We have characterized the oxide-confined vertical-cavity surface-emitting laser (VCSEL) using short-tip, tapping-mode tuning fork near-field scanning optical microscopy (TMTF-NSOM). The near-field radiation patterns of the VCSEL were measured. By comparing the topographic and optical images, we attribute the asymmetric transverse modes to the geometric defect outside the oxide aperture. We also performed spatially resolved spectroscopic imaging over the surface of the VCSEL by coupling NSOM to a spectrometer.
Original languageEnglish
JournalScanning
Volume26
Issue number5 SUPPL.
Publication statusPublished - 1 Nov 2004
Externally publishedYes

Keywords

  • Near field
  • Short tip
  • Tapping mode
  • Transverse mode
  • Vertical-cavity surface-emitting laser

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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