Imaging local index variations in an optical waveguide using a tapping-mode near-field scanning optical microscope

Din-ping Tsai, C.W. Yang, S.-Z. Lo, H.E. Jackson

Research output: Journal article publicationJournal articleAcademic researchpeer-review

27 Citations (Scopus)

Abstract

A method has been developed for imaging directly the local index of refraction of optical waveguides using near-field techniques. Imaging local index of refraction variations with two different optical structures, one a well-understood BK-7 glass prism and the other a side-polished optical fiber waveguide has been clearly demonstrated. With an achievable increase in signal to noise, one can obtain high contrast mapping of variations in the refractive index on both optical waveguide structures and on optical materials in total internal reflection with near-field spatial soliton.
Original languageEnglish
Pages (from-to)1039-1041
Number of pages3
JournalApplied Physics Letters
Volume75
Issue number8
DOIs
Publication statusPublished - 23 Aug 1999
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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