Abstract
We present the development of an objective evaluation method based on the integration of X-illumination, morphological fractal analysis and Bayes classifier that aims at characterizing the seam-puckering appearance. The experimental results in our research demonstrate that a highly significant correlation coefficient can be achieved between the estimated grades and the techniciangenerated grades; the presented method is insensitive to the color/ texture of fabrics, thus showing the potential use of our newly developed method to evaluate the seam-puckering appearance objectively and quantitatively.
Original language | English |
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Article number | 043025 |
Journal | Journal of Electronic Imaging |
Volume | 17 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1 Dec 2008 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Computer Science Applications
- Atomic and Molecular Physics, and Optics