Abstract
Three-dimensional butterfly-like Ni architectures were fabricated by a surfactant-assisted hydrothermal method. The Ni architectures, with lengths of about 20 μm and widths of 4-6 μm, were assembled from tens of Ni nanorods with the averaged diameter of about 200 nm. The Ni nanorods were coated by oxide shells. The saturation magnetization of the Ni architectures was found to be 66.2 emu/g. The magnetic loss in the Ni architectures was mainly caused by the natural resonance, while the dielectric relaxation loss was originated from the interfacial relaxation between the oxide shells and the Ni nanorods in addition to the size distribution and morphology of the Ni architectures. Absorbers with a thickness of 2.1 mm exhibited an optimal reflection loss (RL) value of -38.9 dB at 12.8 GHz. RL values exceeding -20 dB in the 8.0-17.8 GHz range were obtained by choosing absorber thicknesses between 1.5 and 3.2 mm. A quarter-wavelength cancellation model was used to explain the observed thickness dependence of RL peak frequency.
Original language | English |
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Pages (from-to) | 1115-1120 |
Number of pages | 6 |
Journal | Materials Research |
Volume | 18 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1 Jan 2015 |
Keywords
- Electromagnetic properties
- Magnetic materials
- Nanomaterials
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanical Engineering
- Mechanics of Materials