Abstract
High-density nonvolatile memories seek for crossbar architecture with the number of in-series cells limited by ON/OFF current ratios of selectors. Here we found one strategy to increase the ratio up to 108; for a ferroelectric LiNbO3 domain-wall memory, where ON/OFF currents originate from the creation/elimination of a conducting domain wall between two antiparallel/parallel domains controlled by bipolar write voltages applied to two side Cu electrodes. The two electrodes were fabricated in different depths (166 nm vs. 235 nm) into the LiNbO3 film thickness. The asymmetric electrode geometries promote the formation of more conductive head-to-head domains after suppressing tail-to-tail domain growth. The tailored memory devices demonstrate robust endurance over 109 switching cycles and good retention in time exceeding 106; s and can be operated in nanosecond speeds with an activation field lowered by 2-3 times.
| Original language | English |
|---|---|
| Pages (from-to) | 913-916 |
| Number of pages | 4 |
| Journal | IEEE Electron Device Letters |
| Volume | 47 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - May 2026 |
Keywords
- asymmetric geometry
- conducting domain wall
- crossbar array
- Ferroelectric LiNbO3 single-crystal film
- non-volatile memory
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
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