HREM study of TiB2/NiAl interfaces in a NiAl-TiB2in-situ composite

Jiyan Dai; Z. P. Xing; Y. G. Wang; D. X. Li; J. T. Guo; L. L. He; H. Q. Ye

doi:10.1016/0167-577X(94)90142-2

HREM study of TiB₂/NiAl interfaces in a NiAl-TiB₂in-situ composite

Jiyan Dai, Z. P. Xing, Y. G. Wang, D. X. Li, J. T. Guo, L. L. He, H. Q. Ye

Research output: Journal article publication › Journal article › Academic research › peer-review

12 Citations (Scopus)

Abstract

The TiB2/NiAl interfaces in reactive hot-pressing (RHP) processed NiAl-20 vol% TiB2in-situ composites were studied by means of high-resolution electron microscopy (HREM) including image simulation. There is no consistent orientation relationship between TiB2particles and the NiAl matrix. In most cases, the TiB2/NiAl interfaces are atomically flat, sharp and free from any interfacial phase. Atomic configuration at the TiB2/NiAl interface was investigated. A thin interfacial amorphous layer between TiB2and NiAl could be observed in some cases, which may act as a stress absorber. It was also observed that a thin interfacial phase which is still undetermined may exist at the TiB2/NiAl interface.

Original language	English
Pages (from-to)	23-27
Number of pages	5
Journal	Materials Letters
Volume	20
Issue number	1-2
DOIs	https://doi.org/10.1016/0167-577X(94)90142-2
Publication status	Published - 1 Jan 1994
Externally published	Yes

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1016/0167-577X(94)90142-2

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title = "HREM study of TiB2/NiAl interfaces in a NiAl-TiB2in-situ composite",

abstract = "The TiB2/NiAl interfaces in reactive hot-pressing (RHP) processed NiAl-20 vol% TiB2in-situ composites were studied by means of high-resolution electron microscopy (HREM) including image simulation. There is no consistent orientation relationship between TiB2particles and the NiAl matrix. In most cases, the TiB2/NiAl interfaces are atomically flat, sharp and free from any interfacial phase. Atomic configuration at the TiB2/NiAl interface was investigated. A thin interfacial amorphous layer between TiB2and NiAl could be observed in some cases, which may act as a stress absorber. It was also observed that a thin interfacial phase which is still undetermined may exist at the TiB2/NiAl interface.",

author = "Jiyan Dai and Xing, {Z. P.} and Wang, {Y. G.} and Li, {D. X.} and Guo, {J. T.} and He, {L. L.} and Ye, {H. Q.}",

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T1 - HREM study of TiB2/NiAl interfaces in a NiAl-TiB2in-situ composite

AU - Dai, Jiyan

AU - Xing, Z. P.

AU - Wang, Y. G.

AU - Li, D. X.

AU - Guo, J. T.

AU - He, L. L.

AU - Ye, H. Q.

PY - 1994/1/1

Y1 - 1994/1/1

N2 - The TiB2/NiAl interfaces in reactive hot-pressing (RHP) processed NiAl-20 vol% TiB2in-situ composites were studied by means of high-resolution electron microscopy (HREM) including image simulation. There is no consistent orientation relationship between TiB2particles and the NiAl matrix. In most cases, the TiB2/NiAl interfaces are atomically flat, sharp and free from any interfacial phase. Atomic configuration at the TiB2/NiAl interface was investigated. A thin interfacial amorphous layer between TiB2and NiAl could be observed in some cases, which may act as a stress absorber. It was also observed that a thin interfacial phase which is still undetermined may exist at the TiB2/NiAl interface.

AB - The TiB2/NiAl interfaces in reactive hot-pressing (RHP) processed NiAl-20 vol% TiB2in-situ composites were studied by means of high-resolution electron microscopy (HREM) including image simulation. There is no consistent orientation relationship between TiB2particles and the NiAl matrix. In most cases, the TiB2/NiAl interfaces are atomically flat, sharp and free from any interfacial phase. Atomic configuration at the TiB2/NiAl interface was investigated. A thin interfacial amorphous layer between TiB2and NiAl could be observed in some cases, which may act as a stress absorber. It was also observed that a thin interfacial phase which is still undetermined may exist at the TiB2/NiAl interface.

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U2 - 10.1016/0167-577X(94)90142-2

DO - 10.1016/0167-577X(94)90142-2

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VL - 20

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EP - 27

JO - Materials Letters

JF - Materials Letters

IS - 1-2

ER -

HREM study of TiB₂/NiAl interfaces in a NiAl-TiB₂in-situ composite

Abstract

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