HREM study of TiB2/NiAl interfaces in a NiAl-TiB2in-situ composite

Jiyan Dai, Z. P. Xing, Y. G. Wang, D. X. Li, J. T. Guo, L. L. He, H. Q. Ye

Research output: Journal article publicationJournal articleAcademic researchpeer-review

11 Citations (Scopus)

Abstract

The TiB2/NiAl interfaces in reactive hot-pressing (RHP) processed NiAl-20 vol% TiB2in-situ composites were studied by means of high-resolution electron microscopy (HREM) including image simulation. There is no consistent orientation relationship between TiB2particles and the NiAl matrix. In most cases, the TiB2/NiAl interfaces are atomically flat, sharp and free from any interfacial phase. Atomic configuration at the TiB2/NiAl interface was investigated. A thin interfacial amorphous layer between TiB2and NiAl could be observed in some cases, which may act as a stress absorber. It was also observed that a thin interfacial phase which is still undetermined may exist at the TiB2/NiAl interface.
Original languageEnglish
Pages (from-to)23-27
Number of pages5
JournalMaterials Letters
Volume20
Issue number1-2
DOIs
Publication statusPublished - 1 Jan 1994
Externally publishedYes

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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