High-speed and highly repeatable polarization-state analyzer for 40-Gb/s system performance monitoring

L. S. Yan, X. Steve Yao, Changyuan Yu, Y. Wang, L. Lin, Z. Chen, A. E. Willner

Research output: Journal article publicationJournal articleAcademic researchpeer-review

6 Citations (Scopus)

Abstract

We demonstrate a fast (<1 ms), all solid-state, highly repeatable, and accurate polarization-state analyzer based on magnetooptic polarization switches. The module is further used for optical signal-to-noise-ratio performance monitoring in a 14×40-Gb/s wavelength-division-multiplexing system.
Original languageEnglish
Pages (from-to)643-645
Number of pages3
JournalIEEE Photonics Technology Letters
Volume18
Issue number4
DOIs
Publication statusPublished - 15 Feb 2006
Externally publishedYes

Keywords

  • Monitoring
  • Optical signal-to-noise ratio (OSNR)
  • Optics communications
  • Polarization
  • Polarization analyzer
  • Polarization-state generation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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