High-resolution X-ray luminescence extension imaging

Xiangyu Ou, Xian Qin, Bolong Huang, Jie Zan, Qinxia Wu, Zhongzhu Hong, Lili Xie, Hongyu Bian, Zhigao Yi, Xiaofeng Chen, Yiming Wu, Xiaorong Song, Juan Li, Qiushui Chen, Huanghao Yang, Xiaogang Liu

Research output: Journal article publicationJournal articleAcademic researchpeer-review

404 Citations (Scopus)


Current X-ray imaging technologies involving flat-panel detectors have difficulty in imaging three-dimensional objects because fabrication of large-area, flexible, silicon-based photodetectors on highly curved surfaces remains a challenge1–3. Here we demonstrate ultralong-lived X-ray trapping for flat-panel-free, high-resolution, three-dimensional imaging using a series of solution-processable, lanthanide-doped nanoscintillators. Corroborated by quantum mechanical simulations of defect formation and electronic structures, our experimental characterizations reveal that slow hopping of trapped electrons due to radiation-triggered anionic migration in host lattices can induce more than 30 days of persistent radioluminescence. We further demonstrate X-ray luminescence extension imaging with resolution greater than 20 line pairs per millimetre and optical memory longer than 15 days. These findings provide insight into mechanisms underlying X-ray energy conversion through enduring electron trapping and offer a paradigm to motivate future research in wearable X-ray detectors for patient-centred radiography and mammography, imaging-guided therapeutics, high-energy physics and deep learning in radiology.

Original languageEnglish
Pages (from-to)410-415
Number of pages6
Issue number7846
Publication statusPublished - 18 Feb 2021

ASJC Scopus subject areas

  • General


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