High-resolution électron microscopy study of interfacial structure in TiB2-Ti0.9W0.1C-SiC in-situ composite

Jiyan Dai, Y. D. Yu, G. J. Zhang, D. X. Li, Y. G. Wang, H. Q. Ye

Research output: Journal article publicationJournal articleAcademic researchpeer-review

1 Citation (Scopus)

Abstract

The ultrafine structure of multiphase ceramics TiB2-Ti0.9W0.1C-SiC formed by the in-situ reactive hot-pressing process has been characterized using high- resolution électron microscopy (HREM) and analytical électron microscopy. The results reveal that TiB2crystallized into plate-Üke shapes, containing TiC plate précipitâtes. Three different orientation relationships between TiC précipitâtes and the TiB2matrix were determined and the formation mechanism was proposed. Crystalline intergranular phase containing Fe, Si and Ti éléments were formed at grain edge intersections. Along the TiB2plates, the intergrowth of 6H-SiC bands were often found. An orientation relationship between the 6H-SiC and TiB2, in which [1120]TiB2[1120]SjCand (0001)TiB2/(0001)SiC, was found and the atomic structures at the TiB2/6H-SiC interface hâve been investigated by HREM combined with image simulations of several proposed models. Comparison of simulated images and the experimentally observed image resulted into an optimal structure model with Ti-B-C-Si stacking sequence at the interface.
Original languageEnglish
Pages (from-to)269-279
Number of pages11
JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume74
Issue number1
DOIs
Publication statusPublished - 1 Jan 1996
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Condensed Matter Physics
  • Physics and Astronomy (miscellaneous)
  • Metals and Alloys

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