High-resolution électron microscopy study of interfacial structure in TiB2-Ti0.9W0.1C-SiC in-situ composite

Jiyan Dai; Y. D. Yu; G. J. Zhang; D. X. Li; Y. G. Wang; H. Q. Ye

doi:10.1080/01418619608239701

High-resolution électron microscopy study of interfacial structure in TiB₂-Ti_0.9W_0.1C-SiC in-situ composite

Jiyan Dai, Y. D. Yu, G. J. Zhang, D. X. Li, Y. G. Wang, H. Q. Ye

Research output: Journal article publication › Journal article › Academic research › peer-review

1 Citation (Scopus)

Abstract

The ultrafine structure of multiphase ceramics TiB2-Ti0.9W0.1C-SiC formed by the in-situ reactive hot-pressing process has been characterized using high- resolution électron microscopy (HREM) and analytical électron microscopy. The results reveal that TiB2crystallized into plate-Üke shapes, containing TiC plate précipitâtes. Three different orientation relationships between TiC précipitâtes and the TiB2matrix were determined and the formation mechanism was proposed. Crystalline intergranular phase containing Fe, Si and Ti éléments were formed at grain edge intersections. Along the TiB2plates, the intergrowth of 6H-SiC bands were often found. An orientation relationship between the 6H-SiC and TiB2, in which [1120]TiB2[1120]SjCand (0001)TiB2/(0001)SiC, was found and the atomic structures at the TiB2/6H-SiC interface hâve been investigated by HREM combined with image simulations of several proposed models. Comparison of simulated images and the experimentally observed image resulted into an optimal structure model with Ti-B-C-Si stacking sequence at the interface.

Original language	English
Pages (from-to)	269-279
Number of pages	11
Journal	Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume	74
Issue number	1
DOIs	https://doi.org/10.1080/01418619608239701
Publication status	Published - 1 Jan 1996
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
General Materials Science
Condensed Matter Physics
Physics and Astronomy (miscellaneous)
Metals and Alloys

More information

10.1080/01418619608239701

Cite this

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title = "High-resolution {\'e}lectron microscopy study of interfacial structure in TiB2-Ti0.9W0.1C-SiC in-situ composite",

abstract = "The ultrafine structure of multiphase ceramics TiB2-Ti0.9W0.1C-SiC formed by the in-situ reactive hot-pressing process has been characterized using high- resolution {\'e}lectron microscopy (HREM) and analytical {\'e}lectron microscopy. The results reveal that TiB2crystallized into plate-{\"U}ke shapes, containing TiC plate pr{\'e}cipit{\^a}tes. Three different orientation relationships between TiC pr{\'e}cipit{\^a}tes and the TiB2matrix were determined and the formation mechanism was proposed. Crystalline intergranular phase containing Fe, Si and Ti {\'e}l{\'e}ments were formed at grain edge intersections. Along the TiB2plates, the intergrowth of 6H-SiC bands were often found. An orientation relationship between the 6H-SiC and TiB2, in which [1120]TiB2[1120]SjCand (0001)TiB2/(0001)SiC, was found and the atomic structures at the TiB2/6H-SiC interface h{\^a}ve been investigated by HREM combined with image simulations of several proposed models. Comparison of simulated images and the experimentally observed image resulted into an optimal structure model with Ti-B-C-Si stacking sequence at the interface.",

author = "Jiyan Dai and Yu, {Y. D.} and Zhang, {G. J.} and Li, {D. X.} and Wang, {Y. G.} and Ye, {H. Q.}",

year = "1996",

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doi = "10.1080/01418619608239701",

language = "English",

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pages = "269--279",

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High-resolution électron microscopy study of interfacial structure in TiB₂-Ti_0.9W_0.1C-SiC in-situ composite. / Dai, Jiyan; Yu, Y. D.; Zhang, G. J. et al.
In: Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, Vol. 74, No. 1, 01.01.1996, p. 269-279.

Research output: Journal article publication › Journal article › Academic research › peer-review

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AB - The ultrafine structure of multiphase ceramics TiB2-Ti0.9W0.1C-SiC formed by the in-situ reactive hot-pressing process has been characterized using high- resolution électron microscopy (HREM) and analytical électron microscopy. The results reveal that TiB2crystallized into plate-Üke shapes, containing TiC plate précipitâtes. Three different orientation relationships between TiC précipitâtes and the TiB2matrix were determined and the formation mechanism was proposed. Crystalline intergranular phase containing Fe, Si and Ti éléments were formed at grain edge intersections. Along the TiB2plates, the intergrowth of 6H-SiC bands were often found. An orientation relationship between the 6H-SiC and TiB2, in which [1120]TiB2[1120]SjCand (0001)TiB2/(0001)SiC, was found and the atomic structures at the TiB2/6H-SiC interface hâve been investigated by HREM combined with image simulations of several proposed models. Comparison of simulated images and the experimentally observed image resulted into an optimal structure model with Ti-B-C-Si stacking sequence at the interface.

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JO - Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

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High-resolution électron microscopy study of interfacial structure in TiB₂-Ti_0.9W_0.1C-SiC in-situ composite

Abstract

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