Hidden markov model for the detection of machine failure

Allen H. Tai; Wai Ki Ching; L. Y. Chan

Hidden markov model for the detection of machine failure

Allen H. Tai, Wai Ki Ching, L. Y. Chan

Department of Applied Mathematics

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

1 Citation (Scopus)

Abstract

Hidden Markov Models (HMMs) are widely used in applied sciences and engineering. The potential applications in manufacturing industries have not yet been fully explored. In this paper, we propose to apply HMM to the detection of machine failure in a process control problem. We propose models for both cases of indistinguishable production units and distinguishable production units. Numerical examples are given to illustrate the effectiveness of the proposed models.

Original language	English
Pages	2009-2020
Number of pages	12
Publication status	Published - 26 Jan 2006
Event	36th International Conference on Computers and Industrial Engineering, ICC and IE 2006 - Taipei, Taiwan Duration: 20 Jun 2006 → 23 Jun 2006

Conference

Conference	36th International Conference on Computers and Industrial Engineering, ICC and IE 2006
Country/Territory	Taiwan
City	Taipei
Period	20/06/06 → 23/06/06

Keywords

Hidden markov model
Machine failure
Statistical control process
Transition probability

ASJC Scopus subject areas

Industrial and Manufacturing Engineering

More information

https://hkumath.hku.hk/~imr/IMRPreprintSeries/2006/IMR2006-7.pdf

Cite this

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abstract = "Hidden Markov Models (HMMs) are widely used in applied sciences and engineering. The potential applications in manufacturing industries have not yet been fully explored. In this paper, we propose to apply HMM to the detection of machine failure in a process control problem. We propose models for both cases of indistinguishable production units and distinguishable production units. Numerical examples are given to illustrate the effectiveness of the proposed models.",

keywords = "Hidden markov model, Machine failure, Statistical control process, Transition probability",

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Hidden markov model for the detection of machine failure. / Tai, Allen H.; Ching, Wai Ki; Chan, L. Y.
2006. 2009-2020 Paper presented at 36th International Conference on Computers and Industrial Engineering, ICC and IE 2006, Taipei, Taiwan.

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

TY - CONF

T1 - Hidden markov model for the detection of machine failure

AU - Tai, Allen H.

AU - Ching, Wai Ki

AU - Chan, L. Y.

PY - 2006/1/26

Y1 - 2006/1/26

N2 - Hidden Markov Models (HMMs) are widely used in applied sciences and engineering. The potential applications in manufacturing industries have not yet been fully explored. In this paper, we propose to apply HMM to the detection of machine failure in a process control problem. We propose models for both cases of indistinguishable production units and distinguishable production units. Numerical examples are given to illustrate the effectiveness of the proposed models.

AB - Hidden Markov Models (HMMs) are widely used in applied sciences and engineering. The potential applications in manufacturing industries have not yet been fully explored. In this paper, we propose to apply HMM to the detection of machine failure in a process control problem. We propose models for both cases of indistinguishable production units and distinguishable production units. Numerical examples are given to illustrate the effectiveness of the proposed models.

KW - Hidden markov model

KW - Machine failure

KW - Statistical control process

KW - Transition probability

UR - http://www.scopus.com/inward/record.url?scp=84886917153&partnerID=8YFLogxK

M3 - Conference presentation (not published in journal/proceeding/book)

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SP - 2009

EP - 2020

T2 - 36th International Conference on Computers and Industrial Engineering, ICC and IE 2006

Y2 - 20 June 2006 through 23 June 2006

ER -

Hidden markov model for the detection of machine failure

Abstract

Conference

Keywords

ASJC Scopus subject areas

More information

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