Hidden markov model for the detection of machine failure

Allen H. Tai, Wai Ki Ching, L. Y. Chan

Research output: Unpublished conference presentation (presented paper, abstract, poster)Conference presentation (not published in journal/proceeding/book)Academic researchpeer-review

Abstract

Hidden Markov Models (HMMs) are widely used in applied sciences and engineering. The potential applications in manufacturing industries have not yet been fully explored. In this paper, we propose to apply HMM to the detection of machine failure in a process control problem. We propose models for both cases of indistinguishable production units and distinguishable production units. Numerical examples are given to illustrate the effectiveness of the proposed models.

Original languageEnglish
Pages2009-2020
Number of pages12
Publication statusPublished - 26 Jan 2006
Event36th International Conference on Computers and Industrial Engineering, ICC and IE 2006 - Taipei, Taiwan
Duration: 20 Jun 200623 Jun 2006

Conference

Conference36th International Conference on Computers and Industrial Engineering, ICC and IE 2006
Country/TerritoryTaiwan
CityTaipei
Period20/06/0623/06/06

Keywords

  • Hidden markov model
  • Machine failure
  • Statistical control process
  • Transition probability

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering

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