Epitaxial (KNa)0.1Sr0.61Ba0.39)0.9Nb2O6 (KNSBN:61) thin films deposited on MgO(100) substrates have been prepared by pulsed laser deposition (PLD). The structural properties of the thin films have been examined by X-ray diffraction analysis. An X-ray diffraction 2θ scan indicates single crystalline layers with the (001) orientation perpendicular to the substrate plane. The optical transmission spectra of the thin films have been obtained in the spectral range of 200–900 nm, and their optical constants (refractive index n and extinction coefficient k) have been determined. It has been found that the refractive index of the thin films is similar to that of a KNSBN:61 single bulk crystal. The birefringent shift as a function of the applied voltage of the thin films on fused silica has been measured, and the quadratic electro optic coefficient R has been derived to be 0.4×10-16(m/V)2 at 6328 Å.
|Number of pages||4|
|Journal||Japanese Journal of Applied Physics|
|Publication status||Published - 2007|
ASJC Scopus subject areas
- Physics and Astronomy(all)