TY - GEN
T1 - Gradient-based End-of-life Criterion of Power Semiconductor Modules
AU - Zhang, Yichi
AU - Zhang, Yi
AU - Yao, Bo
AU - Zhao, Shuai
AU - Wang, Huai
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - This paper proposes a gradient-based End-of-Life (EOL) criterion with the application example in power semicon-ductor modules. The widely used criterion to determine the EOL of IGBTs in power cycling test is certain percentage of increase of the on-state voltage. Nevertheless, it suffers from significant inconsistency among testing samples in the EOL-based cycle-to-failure with respect to its actual cycle-to-failure considering the thermal limit, that is, the cycle-to-failure margin. The proposed EOL criterion is based on the evolution of the change rate of the on-state voltage, which shows much more consistent cycle-to-failure margins. Experimental case studies demonstrate the application of the proposed EOL criterion and its advantages.
AB - This paper proposes a gradient-based End-of-Life (EOL) criterion with the application example in power semicon-ductor modules. The widely used criterion to determine the EOL of IGBTs in power cycling test is certain percentage of increase of the on-state voltage. Nevertheless, it suffers from significant inconsistency among testing samples in the EOL-based cycle-to-failure with respect to its actual cycle-to-failure considering the thermal limit, that is, the cycle-to-failure margin. The proposed EOL criterion is based on the evolution of the change rate of the on-state voltage, which shows much more consistent cycle-to-failure margins. Experimental case studies demonstrate the application of the proposed EOL criterion and its advantages.
KW - degradation
KW - end-of-life criterion
KW - gradient
KW - power cycling test
KW - power semiconductor modules
KW - reliability
UR - https://www.scopus.com/pages/publications/85162238979
U2 - 10.1109/APEC43580.2023.10131296
DO - 10.1109/APEC43580.2023.10131296
M3 - Conference article published in proceeding or book
AN - SCOPUS:85162238979
T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
SP - 1167
EP - 1171
BT - APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023
Y2 - 19 March 2023 through 23 March 2023
ER -