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Gate oxide induced switch-on undershoot current observed in thin-film transistors
Feng Yan, Piero Migliorato, Yi Hong, V. Rana, R. Ishihara, Y. Hiroshima, D. Abe, S. Inoue, T. Shimoda
Research output: Journal article publication › Journal article › Academic research › peer-review
14
Citations
(Scopus)