The authors present a microscopic description of interface growth with power-law noise distribution in the form P( eta ) eta 1/ approximately1+ mu, which exhibits non-universal roughening. For the mu =d+1 case in d+1 dimensions, the existence of a fractal pattern in the bulk of the aggregate is explained, leading trivially to the proof of the identity alpha +z=2 for the roughening and the dynamical scaling exponents alpha and z respectively. Investigations on the distribution of step sizes of the discretized interface and the saturated growth speed further support the arguments.
ASJC Scopus subject areas
- Statistical and Nonlinear Physics
- Mathematical Physics
- Physics and Astronomy(all)