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Fine structure and interface structure of ion-bombardment nitrided layers
Fengzhao Li
, Dongsheng Sun
, Qing Ao
,
Jiyan Dai
, Douxing Li
, Hengqiang Ye
Research output
:
Journal article publication
›
Journal article
›
Academic research
›
peer-review
1
Citation (Scopus)
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Keyphrases
Interface Structure
100%
Nitrided Layer
100%
Ion Bombardment
100%
Structure Structure
100%
Ion Nitriding
100%
Fe4N
100%
Equus
50%
Nitrogen Atom
50%
High-resolution Transmission Electron Microscopy (HRTEM)
50%
Transmission Electron Microscope
50%
Dislocation
50%
Crystal Defects
50%
Orientation Relationship
50%
Bombing
50%
Compact Structure
50%
Ribbon-like
50%
Ledge
50%
Nitriding Process
50%
Twin Faults
50%
35CrMo Steel
50%
Stacking Defects
50%
Engineering
Nitride Layer
100%
Nitriding
100%
Ion Implantation
100%
Main Reason
50%
Nitriding Process
50%
High Resolution Transmission Electron Microscope
50%
Fine Grain
50%
Nitrogen Atom
50%
Physics
Interface Structure
100%
Fine Structure
100%
Nitriding
100%
Electron Microscope
66%
Crystal Defect
66%
Nitrogen Atom
33%
High Resolution
33%
Material Science
Nitriding
100%
Interface Structure
100%
Ion Bombardment
100%
Crystal Defect
66%