Lead-free (K0.48Na0.48Li0.04)(Nb0.775Ta0.225)O3(KNLNT) thin films were deposited on Pt(111)/Ti/SiO2/Si(001) substrates using pulsed laser deposition. The film exhibited a well-defined ferroelectric hysteresis loop with a remnant polarization 2Prof 22.6 μC/cm2and a coercive field Ecof 10.3 kV/mm. The effective piezoelectric coefficient d33, fof the KNLNT thin films was found to be about 49 pm/V by piezoelectric force microscope. The dominant conduction mechanisms of Au/KNLNT/Pt thin film capacitor were determined to be bulk-limited space-charge-limited-current and Poole-Frenkle emission at low and high electric field strengths, respectively, within a measured temperature range of 130-370 K.
|Journal||Applied Physics Letters|
|Publication status||Published - 10 Jan 2011|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)