Fault-tolerant RFID reader localization based on passive RFID tags

Weiping Zhu, Jiannong Cao, Yi Xu, Lei Yang, Junjun Kong

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

28 Citations (Scopus)

Abstract

With the growing use of RFID-based devices, RFID reader localization attracts increasing attentions recently. In this technology, an object carrying an RFID reader is located by communicating with some passive RFID tags deployed in the environment. One important problem of RFID reader localization is that frequent occurred RFID faults affect localization accuracy. Specifically, complex localization environment (may include metal, water, obstacles, etc.) makes some tags fail to communicate with the reader, which makes the localization result deviate from the real location. Existing approaches can tolerate the faults occurred in individual tags and lasting for a short time period, but suffer serious localization error if the faults exist in a large region and last for a long time period. Moreover, existing approaches do not provide quality measurement of a localization result. In this paper, we propose an effective fault-tolerant RFID reader localization approach suitable for the above-mentioned situations, and illustrate how to measure the quality of a localization result. We have taken extensive simulations and implemented an RFID-based localization system. In both cases, our solution outperforms existing approaches in localization accuracy and can provide additional quality information.
Original languageEnglish
Title of host publication2012 Proceedings IEEE INFOCOM, INFOCOM 2012
Pages2183-2191
Number of pages9
DOIs
Publication statusPublished - 4 Jun 2012
EventIEEE Conference on Computer Communications, INFOCOM 2012 - Orlando, FL, United States
Duration: 25 Mar 201230 Mar 2012

Conference

ConferenceIEEE Conference on Computer Communications, INFOCOM 2012
CountryUnited States
CityOrlando, FL
Period25/03/1230/03/12

ASJC Scopus subject areas

  • Computer Science(all)
  • Electrical and Electronic Engineering

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