TY - GEN
T1 - Fault Diagnosis for Time Series Signal based on Transfer Learning in Time-Frequency Domain
AU - Lo, Wing Chong
AU - Lee, C. K.M.
AU - Wong, Chak Nam
AU - Huang, Jingyuan
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023/6
Y1 - 2023/6
N2 - Time series contributed by sensor signal can be used for fault diagnosis, and machine learning is adopted to identify the causes of failure and the relevant factors in the time-frequency domain. However, the lack of labeled data, incredibly faulty data in various conditions, is one of the significant challenges when applying machine learning approaches. To reduce the barrier of applying those approaches, this study investigated the use of transfer learning. A high accuracy of nearly 95% for classification without the labels in training is found. There is potential research direction in unsupervised domain adaptation and domain generalization.
AB - Time series contributed by sensor signal can be used for fault diagnosis, and machine learning is adopted to identify the causes of failure and the relevant factors in the time-frequency domain. However, the lack of labeled data, incredibly faulty data in various conditions, is one of the significant challenges when applying machine learning approaches. To reduce the barrier of applying those approaches, this study investigated the use of transfer learning. A high accuracy of nearly 95% for classification without the labels in training is found. There is potential research direction in unsupervised domain adaptation and domain generalization.
KW - Domain Generalization
KW - Fault Diagnosis
KW - Time Series
KW - Time-Frequency Analysis
KW - Transfer Learning
KW - Unsupervised Domain Adaptation
UR - http://www.scopus.com/inward/record.url?scp=85170084650&partnerID=8YFLogxK
U2 - 10.1109/ISSSR58837.2023.00072
DO - 10.1109/ISSSR58837.2023.00072
M3 - Conference article published in proceeding or book
AN - SCOPUS:85170084650
T3 - Proceedings - 2023 9th International Symposium on System Security, Safety, and Reliability, ISSSR 2023
SP - 442
EP - 443
BT - Proceedings - 2023 9th International Symposium on System Security, Safety, and Reliability, ISSSR 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 9th International Symposium on System Security, Safety, and Reliability, ISSSR 2023
Y2 - 10 June 2023 through 11 June 2023
ER -