Fatigue mechanism verified using photovoltaic properties of Pb(Zr0.52Ti0.48)O3thin films

Ming Wu; Wei Li; Junning Li; Shaolan Wang; Yaqi Li; Biaolin Peng; Haitao Huang; Xiaojie Lou

doi:10.1063/1.4979525

Fatigue mechanism verified using photovoltaic properties of Pb(Zr_0.52Ti_0.48)O₃thin films

Ming Wu
, Wei Li
, Junning Li
, Shaolan Wang
, Yaqi Li
, Biaolin Peng
, Haitao Huang
, Xiaojie Lou

Research output: Journal article publication › Journal article › Academic research › peer-review

21 Citations (Scopus)

Abstract

The photovoltaic effect and its evolution during electrical fatigue in Pb(Zr0.52Ti0.48)O3(PZT) thin films have been investigated. It is found that the photovoltaic effect of the as-grown PZT thin film is highly affected by the asymmetric Schottky barriers, which can be tuned by applying an external electric field. During fatigue processes, both open-circuit voltage (Voc) and short-circuit current (Jsc) decrease considerably with the increase of the number of electrical cycles. This phenomenon could be ascribed to the degradation of the interfacial layer between the thin film and the electrode induced by highly energetic charge carriers injected from the electrode during bipolar cycling. Our work sheds light on the physical mechanism of both ferroelectric photovoltaics and polarization fatigue in thin-film ferroelectrics.

Original language	English
Article number	133903
Journal	Applied Physics Letters
Volume	110
Issue number	13
DOIs	https://doi.org/10.1063/1.4979525
Publication status	Published - 27 Mar 2017

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

More information

10.1063/1.4979525

http://hdl.handle.net/10397/70848

Cite this

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title = "Fatigue mechanism verified using photovoltaic properties of Pb(Zr0.52Ti0.48)O3thin films",

abstract = "The photovoltaic effect and its evolution during electrical fatigue in Pb(Zr0.52Ti0.48)O3(PZT) thin films have been investigated. It is found that the photovoltaic effect of the as-grown PZT thin film is highly affected by the asymmetric Schottky barriers, which can be tuned by applying an external electric field. During fatigue processes, both open-circuit voltage (Voc) and short-circuit current (Jsc) decrease considerably with the increase of the number of electrical cycles. This phenomenon could be ascribed to the degradation of the interfacial layer between the thin film and the electrode induced by highly energetic charge carriers injected from the electrode during bipolar cycling. Our work sheds light on the physical mechanism of both ferroelectric photovoltaics and polarization fatigue in thin-film ferroelectrics.",

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AU - Wu, Ming

AU - Li, Wei

AU - Li, Junning

AU - Wang, Shaolan

AU - Li, Yaqi

AU - Peng, Biaolin

AU - Huang, Haitao

AU - Lou, Xiaojie

PY - 2017/3/27

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AB - The photovoltaic effect and its evolution during electrical fatigue in Pb(Zr0.52Ti0.48)O3(PZT) thin films have been investigated. It is found that the photovoltaic effect of the as-grown PZT thin film is highly affected by the asymmetric Schottky barriers, which can be tuned by applying an external electric field. During fatigue processes, both open-circuit voltage (Voc) and short-circuit current (Jsc) decrease considerably with the increase of the number of electrical cycles. This phenomenon could be ascribed to the degradation of the interfacial layer between the thin film and the electrode induced by highly energetic charge carriers injected from the electrode during bipolar cycling. Our work sheds light on the physical mechanism of both ferroelectric photovoltaics and polarization fatigue in thin-film ferroelectrics.

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